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Journal of Emerging Trends in Engineering and Applied Sciences (JETEAS)


Article Title: Conducting Particle Contamination in a Gas Insulated Substation (GIS) With Image Charge of the Conductor
by K B V S R Subrahmanyam, J.Amarnath

Metallic particles can be either free to move in the GIS or they may be stuck either to an energized electrode or to an insulator surface. If a metallic particle crosses the gap and comes into contact with the inner electrode or if a metallic particle adheres to the inner conductor, the particle will act as a protrusion on the surface of the electrode, and the voltage required for breakdown of the GIS will also cause a significant reduction of the breakdown voltage. When a particle is positioned near or on the surface of the enclosure, the image charges, due to the presence of the grounded enclosure, have to be considered. Electric fields at the instantaneous contaminated particle locations are computed using Charge Simulation Method(CSM) by considering with and without image charge effects. To determine the particle trajectory in a single phase Gas Insulated Bus duct (GIB) with and without Image Charge Effects ,an enclosure diameter 152 mm and conductor diameter 55 mm is considered. The simulation carried out for various bus configurations with different aluminum, copper and silver wire like particles inside 100KV, 132KV, 145KV and 175KV class enclosure of GIB. The results of the simulation have been presented and analyzed in this paper.
Keywords: electric field, gas insulated substations, metallic particles, particle contamination, gas insulated bus duct
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ISSN: 2141-7016

Editor in Chief.

Prof. Gui Yun Tian
Professor of Sensor Technologies
School of Electrical, Electronic and Computer Engineering
University of Newcastle
United Kingdom



Copyright © Journal of Emerging Trends in Engineering and Applied Sciences 2010