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Journal of Emerging Trends in Engineering and Applied Sciences (JETEAS)


Article Title: Research on the Method of Testability Index Determination for the System-Level BIT Based on Multi-Objective Optimization
by Chunsheng Zhu, Qi Zhang, Hongliang Ran, Fantun Su

By weighing reliability, maintainability, availability and life-cycle cost of equipment which are influenced by testability. The testability indexes of system level BIT are determined on the basis of maximum system reliability & maintainability and minimum the life-circle cost. The influence mathematical models of system reliability, maintainability, availability and life-circle cost are established. According to these mathematical models, the multi-objective optimization model of system level BIT testability indexes is established. By using Non-dominated Sorting Genetic Algorithm ? to solve the multi-objective optimization of an example, the validity of the multi-objective optimization model and the feasibility of the solving method are proved
Keywords: multi-object optimization, built-in test, testability index, non-dominated sorting genetic algorithm ?, design for testability
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ISSN: 2141-7016

Editor in Chief.

Prof. Gui Yun Tian
Professor of Sensor Technologies
School of Electrical, Electronic and Computer Engineering
University of Newcastle
United Kingdom



Copyright © Journal of Emerging Trends in Engineering and Applied Sciences 2010